Description of Invention
E-waste has emerged as a pressing global concern in the modern technological landscape, given the exponential growth in the production of electronic devices. This project presents a novel approach to address the challenge of efficient e-waste recycling by introducing a smart bin system integrated with a deep learning algorithm, "You Only Look Once" Version 5 (YOLOv5). The project aims to enhance the sustainability of e-waste management by automating the classification process and promoting recycling awareness.